Active Device Modeling With IC-CAP

Today's circuit designers have access to many circuit simulation tools for predicting the performance of the designs prior to fabrication. This reduces the number of design cycles, cuts development costs, and brings products to the marketplace faster. In order for these simulation engines to provide accurate results, they must have accurate and up-to-date device models.

IC-CAP delivers the tools you need to build and maintain accurate model libraries for each of these three needs: device design, process engineering, and circuit design. In a single environment, you can now automate measurements, simulate device performance, and extract then optimize device model parameters.

Modeling With IC-CAP

A typical parameter extraction and device modeling procedure in IC-CAP has these steps:

1. Select a device based on your application (MOSFET, BJT, and so on).
2. Make DC, CV, and RF measurements.   » Recommended Hardware Configurations
3. Extract model parameters from measured data using IC-CAP Extraction Modules.
4. Simulate extracted model parameters using model equations from IC-CAP built-in, user-developed, or external simulators' models.
5. Tune and optimize model parameters to best fit measured and simulated results.
6. Use statistics package to build a statistical model.

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