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Installing IC-CAP on PC and UNIX systems. Includes step-by-step installation and configuration procedures, troubleshooting, and background information on the license manager software.
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Creating models, macros, and graphic user interfaces, making measurements, and using transforms and functions. Includes information on simulating, optimizing, programming, managing data, printing and plotting.
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Characterization for the following models: UCB bipolar transistor, UCB MOSFET, BSIM3v3, BSIM4, UCB GaAs MESFET, Curtice GaAs MESFET, and MOS Model 9. In addition, using circuit modeling and the 1/f noise extraction toolkit.
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Using the following models: Agilent Root FET, High-Frequency FET (Curtice), High-Frequency BJT (Gummel-Poon), Agilent Root MOSFET, Agilent Root Diode, Agilent EEFET3/EEHEMT1, Agilent EEBJT2, Mextram, and VBIC. In addition, using IC-CAP with microwave and RF parameter extraction test systems.
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Supported instruments, drivers, simulators, IC-CAP functions, Parameter Extraction Language (PEL), variables, and file structure.
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Using the IC-CAP Statistics package. Includes information on data analysis, data visualization, and file formats.
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Using the plotting, processing, and annotation features available for analyzing data.
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Using the measurement functions to build expressions that process simulation results or the contents of a dataset. Includes general information on the structure and use of equations, along with an extensive function reference.
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Known defects and workarounds, including errors and omissions in the documentation.
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Measurement, modeling, and simulation of electronic components and circuits. ONLY AVAILABLE AT THE DOCUMENTATION WEBSITE.
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Global Search of all IC-CAP documentation.
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Links to PDF files for all IC-CAP documentation.
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