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  October  2007 | Issue 101
In This Issue:
Also of Interest:
Last chance to save on new EM tools.
 
Features
Revealing Glimpse Inside Agilent EEsof EDA

Jack Horgan of EDA Weekly, recently interviewed General Manger Jim McGillivary in which Jim divulges division financial information never before disclosed.

David Vye of Microwave Journal, interviewed Senior Manager Todd Cutler about the recent Momentum GX product announcement and why we chose to integrate it inside Genesys.


Reminder: ADS/RFDE 2006 Update 3 is Available

The latest release of these products can be downloaded from the Knowledge Center. ADS Update 3 is the third update in a row that has added features to address the needs of high-speed SI designers. RFDE Update 3 contains new features for RFIC verification, expanded device models.

Important Note: this is the only way to get the latest defect fixes along with new content. We will no longer provide Maintenance Software Releases (MSRs). All new features and defect fixes will be provided in Update Releases.


Working on 3GPP-LTE Designs?

Familiarize yourself with this emerging and rapidly evolving 4G air interface with a technology overview that demonstrates how Agilent solutions can help you introduce quality LTE 3GPP devices.

Recorded Webcasts: Concepts of LTE covers the basics of 3GPP-LTE layer1 PHY architecture along with design challenges that you may face. Design & Verification Challenges of 3GPP LTE highlights Agilent ADS and our 3GPP-LTE wireless library in the design and simulation of an LTE system.

Recorded Demo: Agilent 3GPP Library with MXA shows ADS running inside an Agilent MXA spectrum analyzer, controlling an Agilent MXG signal generator for complete one button BER analysis of a 3GPP-LTE RF DUT.


New and Updated ADS Component Libraries

Banpil Photonics - new high-speed metallic interconnects library enables design and simulation of chip-to-chip, board-to-board, and rack-to-rack interconnects.

Modelithics - Non-Linear Transistor Model Library upgrade, adds several new models, representing dual-gate MOSFET, LDMOS, HBT and HEMT from NXP, NEC and Mitsubishi companies.

If you are ever in doubt about a component library, check our partner’s website


Take a Closer Look at Synthesis Tools

Providing users with valuable design information is important to us. Here are some video tutorials on using key Genesys product features. ADS users can now access these Genesys tools via the RF Architect for ADS product.

Check out all the Genesys video tutorials.


Free Momentum GX e-Learning Course

In this 40 min, self-paced training, you can see how to access, setup and run EM simulations with Momentum inside Genesys. If you like what you see, why not request an evaluation copy of Momentum GX.


Last Chance to Save on New EM tools for GENESYS and ADS  

See the hot new 3D EM tools in our ADS and GENESYS portfolios. These physical-design solutions are accurate, reliable, and integrated for ease-of-use. Take advantage of an introductory program that will give you unprecedented savings (from 20% to up to 40%) on your purchase if you act before 31 October 2007.


Mind Bender: Test Your Intellect

A table tennis (ping pong) ball fell into a circular cavity in the floor - a closed-off drain pipe - that was a foot deep and only slightly larger than the diameter of the ball.  How would you get the ball out of the hole, with no damage? Solution

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Events
Americas -- Events
  Webcast: Why Do Measurement-Based Channel Modeling?
This presentation will discuss various measurement and modeling techniques that are used to characterize today’s high speed digital channels.

  Conference: MILCOM

29 - 30 October 2007, Gaylord Palms Hotel, Orlando, FL

Stop by booth #1529 to see our software and test equipment combined in the design, implementation and evaluation of Software Defined Radios.

  Workshop: 3D EM Hands-on
Here is your chance to try for our new 3D EM products; "EMDS-for-ADS" and AMDS. Learn how to set up and simulate bondwires, finite dielectric bricks, and various types of antennas.

  Tradeshow: Electrical Performance of Electronic Packaging

29 - 31 October 2007, Atlanta, GA
We will be featuring demos of Signal Integrity analysis using Advanced Design System (ADS) and of the Physical Layer Test System (PLTS).

Europe -- Events
  Workshop: Device Characterization and Simulation

17 October 2007, Eindhoven, The Netherlands

This workshop will review the tools and techniques necessary to
characterize modern semiconductor devices.

Training
North/South America -- Training
  Advanced Design Fundamentals Class (3 day)
  Nov 13 Nov 15 Schaumburg, IL
  Dec 11 Dec 13 Santa Clara, CA

  Advanced Design System Layout (2 day)
  Dec 4 Dec 5 Andover, MA

  Designing for Signal Integrity with ADS (3 day)
  Nov 27 Nov 29 Richardson, TX

  Genesys Concepts (3 day)
  Nov 13 Nov 15 Andover, MA

  IC-CAP User Training (3 day)
  Oct 30 Nov 1 Elkridge, MA

  Momentum for ADS Users (2 day)
  Dec 6 Dec 7 Andover, MA

  Using ADS Communication Systems Designer (3 day)
  Oct 30 Nov 1 Englewood, CO

All classes are subject to change and/or cancellation.
Class descriptions and registration
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Europe -- Training
  ADS Learning Week
  Nov 26 Nov 30 Munich, Germany

  Genesys Learning Days
  Dec 5 Dec 7 Boblingen, Germany

For more information about our Learning weeks, please contact Nathalie RAOUL by email (nathalie_raoul@agilent.com) or by phone (+33 1 64 53 58 29)
Japan -- Training
  ADS Quick Start (1 day)
  Nov 8   Shin-yokohama,Japan
  Dec 6     Shin-yokohama,Japan

  ADS Fundamentals (3 days)
  Nov 14 Nov 16 Shin-yokohama,Japan
  Dec 12 Dec 14 Shin-yokohama,Japan

  ADS Communication System Design (3 days)
  Nov 20  Nov 22 Shin-yokohama,Japan

  ADS Circuit Advanced (2 days)
  Oct 18 Oct 19 Shin-yokohama,Japan
  Dec 20 Dec 21 Shin-yokohama,Japan

  ADS Momentum (1 day)
  Nov 9   Shin-yokohama,Japan
  Dec 7     Shin-yokohama,Japan

  Ptolemy Quick Start (1 day)
  Oct 25   Shin-yokohama,Japan
  Dec 17   Shin-yokohama,Japan

  ADS SysBER (1 day)
  Oct 26   Shin-yokohama,Japan

All classes are subject to change and/or cancellation.
Class descriptions and registration
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© Agilent Technologies, Inc. 2007
 

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